4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition

Michael Bruce

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Fiber optic semiconductor analysis arrangement and method...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Laser beam induced phenomena detection

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Laser induced current for semiconductor defect detection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Semiconductor analysis arrangement and method therefor

Classifying – separating – and assorting solids – Sorting special items – and certain methods and apparatus for... – Condition responsive means controls separating means
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Semiconductor analysis arrangement and method therefor

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Profile ID: LFUS-PAI-P-2107782

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