4. Semiconductor device manufacturing: process
  5. Making device or circuit emissive of nonelectrical signal
  6. Packaging or treatment of packaged semiconductor

Mauro Marchi

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BMEMS-type high-sensitivity inertial sensor and...

Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
Reexamination Certificate

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Method for manufacturing a micro-electro-mechanical device,...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Packaging or treatment of packaged semiconductor
Reexamination Certificate

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Method for manufacturing a micro-electro-mechanical device,...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Packaging or treatment of packaged semiconductor
Reexamination Certificate

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Micro-electro-mechanical structure having electrically...

Measuring and testing – Speed – velocity – or acceleration – Angular rate using gyroscopic or coriolis effect
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Read/write assembly for magnetic hard disks

Dynamic magnetic information storage or retrieval – Head mounting – For adjusting head position
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Profile ID: LFUS-PAI-P-2403828

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