4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Test or calibration structure

Mathew L. Gilk

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Circuit contact to test apparatus

Electrical connectors – Preformed panel circuit arrangement – e.g. – pcb – icm – dip,... – With provision to conduct electricity from panel circuit to...
Reexamination Certificate

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Electronic device test set and contact used therein

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Grounding inserts

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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integrated circuit contact to test apparatus

Electrical connectors – Preformed panel circuit arrangement – e.g. – pcb – icm – dip,... – With provision to conduct electricity from panel circuit to...
Reexamination Certificate

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Test socket

Electrical connectors – Preformed panel circuit arrangement – e.g. – pcb – icm – dip,... – With provision to conduct electricity from panel circuit to...
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Profile ID: LFUS-PAI-P-2849191

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