Electronic device test set and contact used therein

Details Electronic device test set and contact used therein Electronic device test set and contact used therein

2007-02-22

2009-12-29

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S757020, C324S761010, C439S073000, C439S482000

Reexamination Certificate

active

07639026

ABSTRACT:
A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the contact is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested.

REFERENCES:
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patent: 5594355 (1997-01-01), Ludwig
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patent: 5781022 (1998-07-01), Wood et al.
patent: 2002/0045365 (2002-04-01), Lee
patent: 2004/0217771 (2004-11-01), Leong
patent: 2004/0248448 (2004-12-01), Gilk
patent: 1 482 595 (2004-12-01), None

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