Test socket

Details Test socket Test socket

2006-07-07

2008-11-04

Patel, Tulsidas C. (Department: 2839)

Electrical connectors

Preformed panel circuit arrangement, e.g., pcb, icm, dip,...

With provision to conduct electricity from panel circuit to...

Reexamination Certificate

active

07445465

ABSTRACT:
An improved test socket for use in testing integrated circuits. The test socket includes a housing having one or more slots formed therein. Contacts can be received within respective slots and maintained therein with rear ends of the contacts in engagement with traces on a load board. Mounting is accomplished by means of a pair of elastomers, and the elastomers maintain each contact such that, when the front end of a contact is engaged by the lead or pad of the device to be tested and urged into its corresponding slot, an arcuate surface at a rear end of each contact rolls across its corresponding trace with virtually no translational or rotational sliding.

REFERENCES:
patent: 4980245 (1990-12-01), Marino
patent: 5069629 (1991-12-01), Johnson
patent: 5189363 (1993-02-01), Bregman et al.
patent: 5609489 (1997-03-01), Bickford et al.
patent: 5634801 (1997-06-01), Johnson
patent: 6231353 (2001-05-01), Rathburn
patent: 6244874 (2001-06-01), Tan
patent: 6572388 (2003-06-01), Lee
patent: 6854981 (2005-02-01), Nelson
patent: 2003/0068908 (2003-04-01), Brandt et al.
patent: 2004/0067665 (2004-04-01), Nakano
patent: 2004/0248448 (2004-12-01), Gilk

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