4. Radiant energy
  5. Irradiation of objects or material
  6. Irradiation of semiconductor devices

Masakatsu Hasuda

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Ion beam apparatus, ion beam processing method and sample...

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
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Ion beam device and ion beam processing method

Radiant energy – Inspection of solids or liquids by charged particles – Positive ion probe or microscope type
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Ion beam device and ion beam processing method, and holder...

Radiant energy – Methods including separation or nonradiant treatment of test...
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Sample holding mechanism and sample working/observing apparatus

Measuring and testing – Sampler – sample handling – etc. – Sample holder
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Profile ID: LFUS-PAI-P-2830476

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