4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Mark Templeton

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Method for identification of faulty or weak functional logic...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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System and method for assured built in self repair of memories

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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System and method for identification of faulty or weak...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Yield maximization in the manufacture of integrated circuits

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2640197

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