Mark L. DiOrio

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Method of connecting an IC component with another electrical com

Metal working – Method of mechanical manufacture – Electrical device making
Patent

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Planarizing and testing of BGA packages

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Probing system uses a probe device including probe tips on a...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Probing system uses a probe device including probe tips on a...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Stadium-stepped package for an integrated circuit with air diele

Patent

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Profile ID: LFUS-PAI-P-275452

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