Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-12-13
2005-12-13
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S755090, C324S761010
Reexamination Certificate
active
06975127
ABSTRACT:
The planarity of external terminals or a ball grid array on a device package can be improved through use of test probes that flatten the electrical terminals while forming the electrical contacts for package testing. After testing, the package has external terminals with improved planarity that improves the electrical connections formed during assembly of a system containing the package.
REFERENCES:
patent: 5055778 (1991-10-01), Okubo et al.
patent: 5289631 (1994-03-01), Koopman et al.
patent: 5513430 (1996-05-01), Yanof et al.
patent: 5604446 (1997-02-01), Sano
patent: 5642056 (1997-06-01), Nakajima et al.
patent: 5804983 (1998-09-01), Nakajima et al.
patent: 5828225 (1998-10-01), Obikane et al.
patent: 6075373 (2000-06-01), Iino
patent: 6359456 (2002-03-01), Hembree et al.
patent: 6426636 (2002-07-01), Das et al.
patent: 6426637 (2002-07-01), Dang et al.
patent: 6426639 (2002-07-01), Farnworth et al.
patent: 6552555 (2003-04-01), Nuytkens et al.
patent: 6621710 (2003-09-01), Cheng et al.
Celerity Research, Inc.
Millers David T.
Nguyen Jimmy
LandOfFree
Planarizing and testing of BGA packages does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Planarizing and testing of BGA packages, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Planarizing and testing of BGA packages will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3515241