4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Mark Deome

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Generating and controlling analog and digital signals on a...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Method and apparatus for distributed test pattern decompression

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Separating device response signals from composite signals

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
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Separating device response signals from composite signals

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

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Single platform electronic tester

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2481652

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