4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Lumped type parameters

M. Ray Fairchild

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Circuitry for measuring mechanical stress impressed on a...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Electronic assembly including multiple substrates

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Entirely of metal except for feedthrough
Reexamination Certificate

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Fabrication of thick film electrical components

Electrical resistors – With terminal – Terminal and resistance element disposed in flat layers
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Integrated cooling system for electronic devices

Electricity: electrical systems and devices – Housing or mounting assemblies with diverse electrical... – For electronic systems and devices
Reexamination Certificate

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Technique for compensating for substrate shrinkage during...

Semiconductor device manufacturing: process – With measuring or testing
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Profile ID: LFUS-PAI-P-2878426

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