Circuitry for measuring mechanical stress impressed on a...

Details Circuitry for measuring mechanical stress impressed on a... Circuitry for measuring mechanical stress impressed on a...

2005-06-07

2005-06-07

Deb, Anjan K. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S071100, C073S862627, C338S047000

Reexamination Certificate

active

06903561

ABSTRACT:
A circuit for measuring mechanical stress impressed on a printed circuit board includes a number of electrically conductive pads formed on at least one outer surface of the printed circuit board, and a resistive material applied in a pattern to the printed circuit board and defining a resistor between first and second ones of the number of electrically conductive pads. The resistive material exhibits an electrical resistance that varies as the resistive material is deformed so that the resistor exhibits an electrical resistance value that varies as a function of mechanical stress impressed on the printed circuit board sufficient to deform the resistive material defining the resistor. Any number of such resistors may be formed on or within the printed circuit board, and any such resistor may form part of an external resistor bridge network configured to monitor changes in its resistance value.

REFERENCES:
patent: 4261195 (1981-04-01), Lockery
patent: 4380171 (1983-04-01), Smith
patent: 4555954 (1985-12-01), Kim
patent: 4644101 (1987-02-01), Jin et al.
patent: 4876120 (1989-10-01), Belke et al.
patent: 5122929 (1992-06-01), Palanisamy et al.
patent: 5943044 (1999-08-01), Martinelli et al.
patent: 5981883 (1999-11-01), Shriver
patent: 6098464 (2000-08-01), Avisse et al.
patent: 6417678 (2002-07-01), Furukawa
patent: 2004/0183648 (2004-09-01), Weber et al.

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