4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Luca Fasoli

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Array containing charge storage and dummy transistors and...

Static information storage and retrieval – Read/write circuit – Differential sensing
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Bad page marking strategy for fast readout in memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Cross point memory cell with distributed diodes and method...

Static information storage and retrieval – Systems using particular element – Resistive
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Method and system for temperature compensation for memory...

Static information storage and retrieval – Read/write circuit – Differential sensing
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Method for fabricating programmable memory array structures...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
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Profile ID: LFUS-PAI-P-2254901

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