4. Image analysis
  5. Pattern recognition

Kyoko Izuha

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Calculating method, verification method, verification...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Calculating method, verification method, verification...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Design layout preparing method

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Exposure method, exposure system and recording medium

Photocopying – Projection printing and copying cameras – Methods
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Film thickness prediction method, layout design method, mask...

Semiconductor device manufacturing: process – With measuring or testing
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Profile ID: LFUS-PAI-P-2174896

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