Design layout preparing method

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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Details

C716S030000, C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

11012491

ABSTRACT:
There is disclosed a method of producing a design layout by optimizing at least one of design rule, process proximity correction parameter and process parameter, including calculating a processed pattern shape based on a design layout and a process parameter, extracting a dangerous spot having an evaluation value with respect to the processed pattern shape, which does not satisfy a predetermined tolerance, generating a repair guideline of the design layout based on a pattern included in the dangerous spot, and repairing that portion of the design layout which corresponds to the dangerous spot based on the repair guideline.

REFERENCES:
patent: 6507931 (2003-01-01), Kotani et al.
patent: 6576147 (2003-06-01), Mukai
patent: 2003/0093767 (2003-05-01), Murai et al.
patent: 2003/0115569 (2003-06-01), Ikeuchi
patent: 2004/0015794 (2004-01-01), Kotani et al.
patent: 2002-026126 (2002-01-01), None
patent: 2002-131882 (2002-05-01), None
patent: 2003-303742 (2003-10-01), None

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