4. Static information storage and retrieval
  5. Floating gate
  6. Particular biasing

Kyeong-Man Ra

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Charge gain stress test circuit for nonvolatile memory and...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Charge gain stress test circuit for nonvolatile memory and...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Erase verifying apparatus in serial flash memory having redundan

Static information storage and retrieval – Floating gate – Particular biasing
Patent

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Method for fabricating nonvolatile memory device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Patent

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Method of fabricating nonvolatile memory device

Semiconductor device manufacturing: process – Making device array and selectively interconnecting – With electrical circuit layout
Patent

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Profile ID: LFUS-PAI-P-332312

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