4. Coating processes
  5. Direct application of electrical, magnetic, wave, or...
  6. Pretreatment of substrate or post-treatment of coated substrate

Kurt H. Weiner

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Apparatus and methods for detection of systematic defects

Data processing: structural design – modeling – simulation – and em – Modeling by mathematical expression
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Apparatus and methods for determining and localization of...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Apparatus and methods for managing reliability of...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate

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Apparatus and methods for monitoring self-aligned contact...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Apparatus and methods for predicting multiple product chip...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
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Profile ID: LFUS-PAI-P-534408

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