4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Koji Tsubusaki

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Critical dimension measuring method

Radiant energy – Inspection of solids or liquids by charged particles – Methods
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Critical dimension measuring method and equipment thereof

Image analysis – Histogram processing – With pattern recognition or classification
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Method and apparatus for processing pattern image data by SEM

Image analysis – Histogram processing – For setting a threshold
Patent

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Method and apparatus for processing pattern image data by SEM

Image analysis – Histogram processing – For setting a threshold
Patent

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Profile ID: LFUS-PAI-P-1347497

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