4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

KLA-Tencor Corp.

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Beam profile ellipsometer with rotating compensator

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Computer-implemented methods for determining if actual...

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Analysis and verification
Reexamination Certificate

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Computer-implemented methods, carrier media, and systems for...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Computer-implemented methods, computer-readable media, and...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Computer-implemented methods, systems, and computer-readable...

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle
Reexamination Certificate

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