Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2008-05-06
2011-12-06
Nguyen, Tu (Department: 2886)
Image analysis
Applications
Manufacturing or product inspection
Reexamination Certificate
active
08073240
ABSTRACT:
Computer-implemented methods, computer-readable media, and systems for identifying one or more optical modes of an inspection system as candidates for use in inspection of a layer of a wafer are provided. One method includes determining one or more characteristics of images of the layer of the wafer acquired using the inspection system and different optical modes available on the inspection system. The method also includes identifying a first portion of the different optical modes as not candidates for use in the inspection of the layer of the wafer based on the one or more characteristics of the images. In addition, the method includes generating output by eliminating the first portion of the different optical modes from the different optical modes at which the images were acquired such that the output includes a second portion of the different optical modes indicated as the candidates for use in the inspection.
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International Search Report and Written Opinion for PCT/US08/62870 mailed on Jul. 24, 2008.
Ding Ping
Fischer Verlyn
Hill Andrew
Hiriyannaiah Harish
Maher Chris
KLA-Tencor Corp.
Mewherter Ann Marie
Nguyen Tu
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