4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Test or calibration structure

Kiyoaki Iwasa

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MOS TEG structure

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Semiconductor integrated circuit

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Semiconductor memory device

Static information storage and retrieval – Read/write circuit – Including specified plural element logic arrangement
Reexamination Certificate

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Profile ID: LFUS-PAI-P-375259

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