Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent
1995-11-13
1997-12-30
Jackson, Jerome
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
437 8, 324769, 3241581, 257401, H01L 2358
Patent
active
057033811
ABSTRACT:
A semiconductor integrated circuit includes a rectangular semiconductor chip having a main surface, a plurality of pads formed in a peripheral portion of the main surface of the semiconductor chip, for connection to external connecting members, a plurality of circuit elements of an integrated circuit formed in an area of the main surface other than an area in which the plurality of pads are formed, and at least one characteristic evaluating circuit element connected to at least one of the plurality of circuit elements of the integrated circuit by sharing an impurity doped region which forms part of the at least one circuit element with the at least one circuit element of the integrated circuit in an area of the main surface other than the peripheral portion in which the plurality of pads are formed.
REFERENCES:
patent: 4931844 (1990-06-01), Zommer
patent: 5250823 (1993-10-01), Veendrick et al.
Iwasa Kiyoaki
Ohshima Shigeo
Guay John
Jackson Jerome
Kabushiki Kaisha Toshiba
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