Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Inventor
active
On-line partitioning for sequential circuit test generation
Segmented compaction with pruning and critical fault...
Static test sequence compaction using two-phase restoration and
System and method for automatically mapping state elements...
Vector restoration using accelerated validation and refinement
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Profile ID: LFUS-PAI-P-1403151