4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Superconductive contact or lead
  6. Transmission line or shielded

Kenneth Wilsher

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Apparatus and method for probing integrated circuits using...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Apparatus and method for probing integrated circuits using...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Method and apparatus for accessing internal nodes of an...

Active solid-state devices (e.g. – transistors – solid-state diode – Superconductive contact or lead – Transmission line or shielded
Reexamination Certificate

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Method and apparatus for measuring high-bandwidth electrical...

Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2768309

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