4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital data error correction

Kenichi Origasa

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Random access memory device

Static information storage and retrieval – Addressing – Sync/clocking
Reexamination Certificate

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Semiconductor integrated circuit

Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate

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Semiconductor integrated circuit device and method of...

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – With specific source of supply or bias voltage
Reexamination Certificate

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Semiconductor memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Semiconductor memory

Static information storage and retrieval – Addressing – Particular decoder or driver circuit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2277187

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