4. Data processing: generic control systems or specific application
  5. Specific application, apparatus or process
  6. Robot control

Keith W. Melcher

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Adjustable lithography blocking device and method

Radiant energy – Radiant energy generation and sources – With radiation modifying member
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Error reduction in semiconductor processes

Radiation imagery chemistry: process – composition – or product th – Including control feature responsive to a test or measurement
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Error reduction in semiconductor processes

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Robot crash sensor system

Data processing: generic control systems or specific application – Specific application – apparatus or process – Robot control
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Semiconductor wafer edge marking

Active solid-state devices (e.g. – transistors – solid-state diode – Alignment marks
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Profile ID: LFUS-PAI-P-2148144

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