Karl Platzoeder

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Characteristic impedance-correct chip carrier for microwave semi

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Method for the production of n-doped silicon with a dish-shaped

Metal treatment – Compositions – Heat treating
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Pressure sensor

Measuring and testing – Fluid pressure gauge – Diaphragm
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Semiconductor component having patterned recombination center me

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Profile ID: LFUS-PAI-P-63350

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