4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Lumped type parameters

Kai-Hsiang Yen

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Electro-acoustic sensing device

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Physical deformation
Reexamination Certificate

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Fabrication method for microstructures with high aspect ratios

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Method for measuring the etching speed

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Microelectronic tunable capacitor and method for fabrication

Electricity: electrical systems and devices – Electrostatic capacitors – Variable
Reexamination Certificate

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Sensor

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2336292

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