4. Static information storage and retrieval
  5. Read/write circuit
  6. Including reference or bias voltage generator

Jürgen Auge

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Arrangement for determining a temperature loading of an...

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate

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Integrated circuit for storing operating parameters

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Integrated semiconductor memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2971494

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