4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Junko Izumitani

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Inspection data analyzing apparatus for in-line inspection with

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Manufacturing method of semiconductor device having...

Semiconductor device manufacturing: process – Having magnetic or ferroelectric component
Reexamination Certificate

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Method of manufacturing semiconductor device and...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

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Semiconductor device and apparatus and method for...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Semiconductor device and method of manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified configuration
Reexamination Certificate

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Profile ID: LFUS-PAI-P-800047

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