4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Of circuit

Jonggook Kim

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Current mirror methodology quantifying time dependent...

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate

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Method and structure for testing metal-insulator-metal...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method for quantifying safe operating area for bipolar...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2893003

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