Current mirror methodology quantifying time dependent...

Details Current mirror methodology quantifying time dependent... Current mirror methodology quantifying time dependent...

2004-09-10

2008-09-09

Verbitsky, Gail (Department: 2855)

Thermal measuring and testing

Temperature measurement

By electrical or magnetic heat sensor

C324S765010, C374S001000, C702S099000

Reexamination Certificate

active

07422366

ABSTRACT:
A current mirror method is provided that can be utilized to evaluate thermal issues is silicon-on-insulator (SOI) bipolar junction transistors (BJTs). The method significantly improves safe operating area (SOA) measurement sensitivity. Unlike conventional methods, the current mirror method can provide quantitative analysis of the BJTs thermal instability over a wide power range, even in the apparent SOA of the device. This method can also predict and evaluate SOA with respect to emitter ballast resistance and current crowding.

REFERENCES:
patent: 4669026 (1987-05-01), Widlar
patent: 5502399 (1996-03-01), Imai
patent: 5521490 (1996-05-01), Manohar
patent: 5619430 (1997-04-01), Nolan et al.
patent: 5654896 (1997-08-01), Ochi
patent: 6043714 (2000-03-01), Yamamoto et al.
patent: 6304129 (2001-10-01), Blair et al.
patent: 6529066 (2003-03-01), Guenot et al.
patent: 6807042 (2004-10-01), Spampinato et al.
patent: 6811309 (2004-11-01), Ravishanker
patent: 7015745 (2006-03-01), Burinskiy et al.
patent: 10135403 (1998-05-01), None
Shaikh F. Shams et al., Motorola, Inc. “SiGe HBT Self-Heating Modeling and Characterization from AC Data”, IEEE BCTM 5.2, pp. 92-95, no date.

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