Method for quantifying safe operating area for bipolar...

Details Method for quantifying safe operating area for bipolar... Method for quantifying safe operating area for bipolar...

2005-08-16

2005-08-16

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C257S139000, C257S335000, C257S378000, C257S592000, C438S268000

Reexamination Certificate

active

06931345

ABSTRACT:
A method for quantifying safe operating regions within a safe operating area (SOA) for a bipolar junction transistor (BJT) by driving the device under test (DUT) as part of a current mirror circuit and monitoring variances in the current mirror ratio for various biasing conditions.

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patent: 5557139 (1996-09-01), Palara
patent: 5909039 (1999-06-01), Bakowski et al.
patent: 6121089 (2000-09-01), Zeng et al.
patent: 6405148 (2002-06-01), Hayashi et al.
Michael G. Adlerstein, Thermal Stability of Emitter Ballasted HBT's, IEEE Transaction on Electron Devices, Aug. 1998, pp. 1653-1655, vol. 45, No. 8.

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