4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

John A. Gurley

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Atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Atomic force microscope for small samples having dual-mode opera

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Compact atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Profile ID: LFUS-PAI-P-246456

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