4. Excavating

John A. De Beule

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Error log system for self-testing in very large scale integrated

Excavating
Patent

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Method and circuitry for enabling internal test operations in a

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Self-testing circuitry for VLSI units

Electricity: measuring and testing – Plural – automatically sequential tests
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Profile ID: LFUS-PAI-P-726856

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