Self-testing circuitry for VLSI units

Details Self-testing circuitry for VLSI units Self-testing circuitry for VLSI units

1989-06-12

1991-04-09

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

371 212, 371 224, 371 225, G01R 3128

Patent

active

050067877

ABSTRACT:
An application specific integrated circuit is provided on a chip where a combinatorial logic circuitry such as a RAM memory array, logic circuitry and control circuitry may be operated in the normal mode with the addition of a built-in, self-test feature whereby the registers can be converted to multifunction shift registers which are connected in a serial fashion to form a shift chain snake through which data patterns can be shifted. Additionally, control circuitry is provided to select certain multifunction shift registers as test pattern generators and other multifunction shift registers are receivers of signatures which can be accessed by a maintenance controller to check proper operability of the system and its combinatorial logic.

REFERENCES:
patent: 4701920 (1987-10-01), Resnick et al.
patent: 4764926 (1988-08-01), Knight et al.
patent: 4835774 (1989-05-01), Ooshima et al.

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