4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Joachim Wienecke

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Apparatus for inspecting a disk-like object

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Arrangement and method for illuminating a specimen field in...

Radiant energy – Photocells; circuits and apparatus – Photocell controls its own optical systems
Reexamination Certificate

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Arrangement and method for inspecting unpatterned wafers

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Holding device for wafers

Material or article handling – Vertically swinging load support – Grab
Reexamination Certificate

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Method and apparatus for high-resolution defect location and...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1831758

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