4. Optics: measuring and testing
  5. By polarized light examination
  6. With light attenuation

Joachim G. Clabes

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Combined scanning force microscope and optical metrology tool

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Metal-polymer adhesion by low energy bombardment

Coating processes – Electrical product produced – Integrated circuit – printed circuit – or circuit board
Patent

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Method of automating chip power consumption estimation...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Nanometer scale probe for an atomic force microscope, and method

Radiant energy – Inspection of solids or liquids by charged particles
Patent

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Profile ID: LFUS-PAI-P-1001109

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