4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

Jitrayut Junnapart

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High speed first pass yield report program and method

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Method and system for testing articles of manufacture

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
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System and method for erase test of integrated circuit...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Profile ID: LFUS-PAI-P-2613311

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