Method and system for testing articles of manufacture

Details Method and system for testing articles of manufacture Method and system for testing articles of manufacture

2005-11-29

2005-11-29

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

C702S119000, C702S186000, C700S121000, C714S719000

Reexamination Certificate

active

06970806

ABSTRACT:
A data processor automatically analyzes test data after a small subset of the lot of IC packages has been tested for determining whether a rescreen condition has occurred in real-time. When the rescreen condition has occurred, a warning is provided in real-time shortly after testing of the small subset. Thus, time is not wasted in testing the whole lot of articles with the rescreen condition, and a small number of failed articles is retested after the rescreen condition is corrected thus maximizing tester utilization.

REFERENCES:
patent: 6154714 (2000-11-01), Lepejian
patent: 6175417 (2001-01-01), Do et al.
patent: 6751514 (2004-06-01), Ando

Affiliated with

Also associated with

Rating

Method and system for testing articles of manufacture does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for testing articles of manufacture, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for testing articles of manufacture will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3517365