4. Image analysis
  5. Applications
  6. 3-d or stereo imaging analysis

Jihong Chen

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Computer aided inspection machine

Image analysis – Applications – 3-d or stereo imaging analysis
Patent

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Method for making a semiconductor device with improved sidewall

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Recessed oxide by localized oxidation
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Method for manufacturing a transistor device having an...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Method for manufacturing a transistor device having an...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Process method of source drain spacer engineering to improve...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Profile ID: LFUS-PAI-P-460567

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