Computer aided inspection machine

Image analysis – Applications – 3-d or stereo imaging analysis

Patent

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Details

356376, 348125, 382141, G06K 900, G01B 1124

Patent

active

060647590

ABSTRACT:
An automatic inspection method and apparatus using structured light and machine vision cameras to inspect an object in conjunction with the geometric model of the object is disclosed. Camera images of the object are analyzed by computer to produce the location of points on the object's surfaces in three dimensions. During a setup phase before object inspection, the points are analyzed with respect to the geometric model computer file of the object. Many points are eliminated to reduce data-taking and analysis time to a minimum and to prevent extraneous reflections from producing errors. When similar objects are subsequently inspected, points from each surface of interest are spatially averaged to give high accuracy measurements of object dimensions. The inspection device uses several multiplexed sensors, each composed of a camera and a structured light source, to measure all sides of the object on a single pass. Calibration and compensation methods are also disclosed.

REFERENCES:
patent: 4842411 (1989-06-01), Wood
patent: 5347363 (1994-09-01), Yamanaka
patent: 5642293 (1997-06-01), Manthey et al.
patent: 5654800 (1997-08-01), Svetkoff
patent: 5862552 (1999-01-01), Yamomoto et al.
patent: 5867592 (1999-02-01), Sasada et al.

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