4. Electrical generator or motor structure
  5. Non-dynamoelectric
  6. Piezoelectric elements and devices

Jens Struckmeier

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Device and method for scanning probe microscopy

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;...
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Force scanning probe microscope

Electrical generator or motor structure – Non-dynamoelectric – Piezoelectric elements and devices
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Force scanning probe microscope

Measuring and testing – Dynamometers – Responsive to force
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Manual control with force-feedback for probe...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Jens Struckmeier does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Jens Struckmeier, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Jens Struckmeier will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-2719171

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure