Force scanning probe microscope

Details Force scanning probe microscope Force scanning probe microscope

2006-05-16

2006-05-16

Noland, Thomas P. (Department: 2856)

Measuring and testing

Dynamometers

Responsive to force

C073S105000

Reexamination Certificate

active

07044007

ABSTRACT:
A force scanning probe microscope (FSPM) and associated method of making force measurements on a sample includes a piezoelectric scanner having a surface that supports the sample so as to move the sample in three orthogonal directions. The FSPM also includes a displacement sensor that measures movement of the sample in a direction orthogonal to the surface and generates a corresponding position signal so as to provide closed loop position feedback. In addition, a probe is fixed relative to the piezoelectric scanner, while a deflection detection apparatus is employed to sense a deflection of the probe. The FSPM also includes a controller that generates a scanner drive signal based on the position signal, and is adapted to operate according to a user-defined input that can change a force curve measurement parameter during data acquisition.

REFERENCES:
patent: 5224376 (1993-07-01), Elings et al.
patent: 5363697 (1994-11-01), Nakagawa
patent: 5477732 (1995-12-01), Yasue et al.
patent: 5705741 (1998-01-01), Eaton et al.
patent: 5874668 (1999-02-01), Xu et al.
patent: 5925818 (1999-07-01), Cleveland et al.
patent: 5948972 (1999-09-01), Samsavar et al.
patent: 6079254 (2000-06-01), Chen et al.
patent: 6257053 (2001-07-01), Tomita et al.
patent: 6452170 (2002-09-01), Zypman et al.
patent: 6608307 (2003-08-01), Baur
patent: 6730905 (2004-05-01), Nakagawa et al.
patent: 6776030 (2004-08-01), Kirpichnikov et al.
patent: 6864483 (2005-03-01), Olin
patent: 2004/0084618 (2004-05-01), Spizig et al.
patent: 759536 (1997-02-01), None
patent: 06307850 (1994-11-01), None
patent: 08146019 (1996-06-01), None
patent: 08201406 (1996-08-01), None
patent: 09043258 (1997-02-01), None
patent: 10170525 (1998-06-01), None
patent: 2000346782 (2000-12-01), None
New Journal of Physics 1 (1999) 6.1-6.11, Single Molecule Force Spectroscopy by AFM Indicates Helical Structure of Poly(ethylene-glycol) in Water, by F. Oesterhelt, M. Rief and H.E. Gaub, month not given.
Applied Physics A 68. 173-176 (1999), AFM, a tool for single-molecule experiments, by M. Ludwig, M. Rief, L. Schmidt, H. Li, F. Oesterheld, M. Gautel and H.E. Gaub, month not given.
Analytical Techniques, 2000, Force Spectroscopy with Single Bio-molecules, by H. Clausen-Schauman, M. Seitz, R. Krautbauer and H.E. Gaub pp. 524-530, month not given.
Science, vol. 276, May 1997, Reversible Unfolding of Individual Titin Immunoglobulin Domains by AFM, by M. Rief, M. Gautel, F. Oesterhelt, J. Fernandez and H. Gaub, pp. 1109-1112.
Article in MaxPlanckForschung, “Physicker und Biochmiker ziehen Molekulare Faden”, Mar. 2000, pp. 26-31 (English translation included). “Physicists and Biochemists Pull Molecular Strings”.

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