4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Jeffery Howard Oppold

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Diagnosable scan chain

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Random access memory having an adaptable latency

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Self-Test pattern to detect stuck open faults

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2507800

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