4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Jee-Yul Kim

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Circuit for testing internal voltage of semiconductor memory...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Memory device with self refresh cycle control function

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Multi-wordline test control circuit and controlling method...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Semiconductor memory device

Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate

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Semiconductor memory device and driving method thereof

Static information storage and retrieval – Read/write circuit – Including level shift or pull-up circuit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2290967

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