Multi-wordline test control circuit and controlling method...

Details Multi-wordline test control circuit and controlling method... Multi-wordline test control circuit and controlling method...

2007-12-20

2009-12-01

Mai, Son L (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S230030, C365S230060

Reexamination Certificate

active

07626875

ABSTRACT:
A multi-wordline test control circuit in a semiconductor integrated device for performing a multi-wordline test in a specified cell mat among a plurality of cell mats. The multi-wordline test control circuit comprises a multi-test control block for receiving a multi-wordline test signal and outputting a first test signal and a second test signal, and a multi-wordline test block for performing the multi-wordline test in a specified cell mat among a plurality of cell mats in response to the first test signal and the second test signal.

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