4. Fishing, trapping, and vermin destroying

James S. Nakos

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Apparatus and method for detecting defective NVRAM cells

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Apparatus and method for forming a battery in an integrated...

Semiconductor device manufacturing: process – Having integral power source
Reexamination Certificate

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Apparatus and method for forming a battery in an integrated...

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – With pn junction isolation
Reexamination Certificate

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Boron out-diffused surface strap process

Fishing – trapping – and vermin destroying
Patent

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Emissivity independent temperature measurement systems

Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Patent

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Profile ID: LFUS-PAI-P-536549

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