4. Electricity: electrical systems and devices
  5. Safety and protection of systems and devices
  6. Load shunting by fault responsive means

James D. Whitfield

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Low voltage NMOS-based electrostatic discharge clamp

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Low voltage NMOS-based electrostatic discharge clamp

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Method for forming an ESD protection device

Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – Self-aligned
Reexamination Certificate

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Resistor triggered electrostatic discharge protection

Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2351485

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