4. Land vehicles: bodies and tops
  5. Bodies
  6. Trunk lids

Jae-Il Lee

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Burn-in test apparatus for BGA packages using forced heat...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Connector for testing a semiconductor package

Electrical connectors – Including elastomeric or nonmetallic conductive portion – Adapted to be sandwiched between preformed panel circuit...
Reexamination Certificate

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Socket including pressure conductive rubber and mesh for...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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System and method for opening and shutting a trunk lid of a vehi

Land vehicles: bodies and tops – Bodies – Trunk lids
Patent

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Wafer treatment method for protecting fuse box of...

Semiconductor device manufacturing: process – Making device array and selectively interconnecting – Using structure alterable to nonconductive state
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1285793

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